26.04.2011
Welcome to the website of the international conference TECHNART 2011.
The aim of TECHNART 2011 is to provide a scientific forum to present and promote the use of analytical spectroscopy techniques in the field of cultural heritage. The conference builds on the momentum of TECHNART 2009 offering an outstanding and unique opportunity for exchanging knowledge on leading edge developments. Cultural heritage studies are interpreted in a broad sense, including pigments, stones, metals, glass, ceramics, chemometrics on artwork studies, resins, fibers, forensic applications in art history, archaeology and conservation science.
TECHNART 2011 is organised by BAM Federal Institute for Materials Research and Testing and will take place from 26 to 29 April 2011 in Berlin, Germany, at BAM Headquarters.
X-ray microanalysis (XRF, PIXE, XRD, SEM-EDX)
Confocal X-ray microscopy (3D Micro-XRF, 3D Micro-PIXE)
Synchrotron, ion beam and neutron based techniques/instrumentation
FT-IR and raman microscopy
UV-Vis and NIR absorption/reflectance and fluorescence
Laser-based analytical techniques
Magnetic resonance techniques
Chromatography (GC, HPLC) and mass spectrometry
Optical imaging and coherence techniques
Mobile spectrometry and remote sensing
We would like to invite you to contribute to a special issue in the context of the TECHNART 2011. The special issue will appear in Analytical and Bioanalytical Chemistry (www.springer.com/abc). Manuscripts need to be critical reviews or full research papers and present original, unpublished work focussing on analytical and bioanalytical themes presented at the conference. Deadline for submissions is May 15, 2011.
More Information here
N.i.Ke. fördert den Austausch zwischen Natur- und Geisteswissenschaften. Es versteht sich als Kommunikations- und Kooperationsplattform der Disziplinen Archäologie und Kunstgeschichte, Restaurierung und Konservierung sowie Natur- und Ingenieurswissenschaften. Es bietet aber auch Informationen für Entscheider aus Politik, Kultur und Wirtschaft, öffentliche und private Eigentümer. Das Netzwerk verfolgt dabei zwei Ziele:
Ansprechpartner
BAM Bundesanstalt für Materialforschung und -prüfung
Unter den Eichen 87
12205 Berlin
E-Mail:
nike@bam.de
Dr. rer. nat. habil.
Oliver Hahn
Unter den Eichen 44-46
12203 Berlin
Telefon:
+49 30 8104-3821
E-Mail:
Oliver.Hahn@bam.de